Shouyuan Shi is a Post-doctor at the University of Delaware at Newark . He received his B.S., M.S. and Ph.D in Microwave and Electromagnetic Engineering from Xidian University, the People's Republic of China. He is a member of the Applied Optics and Electromagnetics Group.

His current research interests include numerical electromagnetics, electromagnetic sacttering, inverse sacttering probelm,  analysis and design of diffractive optics elements and devices.